Title :
A tool to generate models based on behavioral IBIS models
Author :
Deepaksubramanyan, B.S. ; Chen, C. Y Roger ; Nunez, Adrian
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Syracuse Univ., Syracuse, NY, USA
Abstract :
Input/Output Buffer Information Specification (IBIS) behavioral models are widely used for circuit-level signal integrity (SI) analysis due to its fast simulation speed and good accuracy. This work presents a tool to generate models of circuits specified by IBIS models. The model generation tool estimates poles, rise time and fall time of a circuit specified by IBIS models. The method consists of two steps; first regression analysis is performed on IBIS data with Weibull distribution function (WCDF) as the regression function. Based on the estimated parameter values, rise time and fall time values are obtained. The second step involves matching moments of WCDF to circuit moments and obtaining the estimated poles of the system. The method is generic and is scalable in nanometer CMOS. CMOS inverters have been used to demonstrate the methodology.
Keywords :
CMOS integrated circuits; Weibull distribution; integrated circuit modelling; nanoelectronics; regression analysis; CMOS inverters; IBIS behavioral models; Weibull distribution function; behavioral IBIS models; circuit moments; circuit-level signal integrity analysis; input/output buffer information specification; matching moments; model generation tool; nanometer CMOS; regression analysis; regression function; Approximation methods; Computational modeling; Data models; Delay; Equations; Integrated circuit modeling; Mathematical model;
Conference_Titel :
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
Conference_Location :
Boise, ID
Print_ISBN :
978-1-4673-2526-4
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2012.6292000
