Title :
Low voltage CMOS timing generator using array of digital delay lock loops
Author :
Balaji, S. ; Srinivasan, K.S.
Author_Institution :
Dept. of ECE, Anna Univ., Chennai, India
Abstract :
In this paper, Low Voltage CMOS Timing Generator Using Array of Digital Delay Lock Loops is presented. The timing generator is implemented as an array of Delay Locked Loops, providing wide operating frequency range. This architecture enables a timing generator with sub-gate delay resolution to be implemented. The proposed Delay Lock Loops use a Dual Phase and Frequency Detector along with a charge pump where the injected charge approaches zero as the loop approaches lock on the leading and the trailing edges of an input clock reference. The Delay Lock Loop lock on both the leading and trailing clock edges as dual Phase and Frequency Detector along with charge pump convert the phase difference into voltage. The start controlled dual Phase and Frequency Detector use a start-controlled circuit to provide a precise output without the locking problem. This array DLL is based on self-biased technique and achieves high process technology independence, fixed damping factor, fixed bandwidth to operating frequency range and input phase offset cancellation. The results show that the total delay time between the input and the output of the DLL (Delay Lock Loop) is one clock cycle and all of the delay cells provide precise output without false locking or harmonic locking. The simulation results show a timing jitter of less than 1pS for the DLL circuit and have very low phase sensitivity errors. The timing generator implemented as an array of Delay Locked Loops has exponentially reduced the locking time as well avoids harmonic locking.
Keywords :
CMOS digital integrated circuits; charge pump circuits; damping; delay lock loops; low-power electronics; phase detectors; timing jitter; array DLL circuit; charge pump converter; clock cycle; delay cells; digital delay lock loops array; dual phase; fixed damping factor; frequency detector; injected charge approaches; input clock reference; low voltage CMOS timing generator; operating frequency range; phase difference; phase offset cancellation; self-biased technique; start-controlled circuit; subgate delay resolution; timing jitter; total delay time; very low phase sensitivity errors; Arrays; CMOS integrated circuits; Clocks; Delay; Phase frequency detector; Voltage control;
Conference_Titel :
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
Conference_Location :
Boise, ID
Print_ISBN :
978-1-4673-2526-4
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2012.6292002