DocumentCode
3204112
Title
Noise/jump phenomenon of relaxation oscillators based on phase change using path integral/lagrangian formulation in quantum mechanics
Author
Leung, Bosco
Author_Institution
Electr. & Comput. Eng. Dept., Univ. of Waterloo, Waterloo, ON, Canada
fYear
2012
fDate
5-8 Aug. 2012
Firstpage
246
Lastpage
249
Abstract
A new approach to investigate noise spikes due to regeneration in a relaxation oscillator is proposed. Noise spikes have not been satisfactorily accounted for in traditional phase noise models. This paper attempts to explain noise spikes/jump phenomenon by viewing it as phase change in the physical world (for example, from gas to liquid or magnetization of ferromagnet). Both are due to regeneration (positive feedback in oscillator as well as alignment of spin due to positive feedback in ferromagnet). The mathematical tool used is the action path integral based on Lagrangian. As a first step towards this explanation in this paper, simulations on circuits using 0.18μm CMOS as well as simulations on ferromagnet (Ising model) were performed and both show jump phenomenon, illustrating the viability of this approach.
Keywords
CMOS integrated circuits; integrated circuit noise; phase noise; quantum theory; relaxation oscillators; CMOS process; Ising model; feedback; ferromagnet; magnetization; noise spikes-jump phenomenon; path integral-Lagrangian formulation; phase change; phase noise model; quantum mechanic; relaxation oscillator regeneration; size 0.18 mum; Integrated circuit modeling; Mathematical model; Noise; Oscillators; Physics; Semiconductor device modeling; Trajectory;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
Conference_Location
Boise, ID
ISSN
1548-3746
Print_ISBN
978-1-4673-2526-4
Electronic_ISBN
1548-3746
Type
conf
DOI
10.1109/MWSCAS.2012.6292003
Filename
6292003
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