• DocumentCode
    3204319
  • Title

    Empirical model for the transconductance-current dependence of short-channel MOSFETs

  • Author

    Prodanov, Vladimir I.

  • Author_Institution
    Electr. Eng. Dept., Cal Poly, San Luis Obispo, CA, USA
  • fYear
    2012
  • fDate
    5-8 Aug. 2012
  • Firstpage
    290
  • Lastpage
    293
  • Abstract
    This work is concerned with the gm-I dependence of sub-micrometer MOSFETs. The transconductance-current expression given by the Advanced Compact Model (ACM) is reviewed and simple modification is proposed. The modification yields an expression which (with proper parametrization) captures the gm-I dependence of short-channel MOSFETs. The proposed expression is “universal” in the sense that it is capable of modeling the gm-I dependence of long-channel MOSFETs, short-channel MOSFETs, and resistively-degenerated BJTs.
  • Keywords
    MOSFET; bipolar transistors; ACM; advanced compact model; empirical model; gm-I dependence; long-channel MOSFET; resistively-degenerated BJT; short-channel MOSFET; submicrometer MOSFET; transconductance-current dependence; Analog circuits; Integrated circuit modeling; MOSFETs; Mathematical model; Semiconductor device modeling; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
  • Conference_Location
    Boise, ID
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4673-2526-4
  • Electronic_ISBN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2012.6292014
  • Filename
    6292014