Title :
Negative-polarity Rod-pinch diode experiments on RITS-6
Author :
Leckbee, Joshua J. ; Oliver, Bryan V. ; Johnston, Mark D. ; Hahn, Kelly D. ; Portillo, Salvador ; Bui, Bill
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
fDate :
June 28 2009-July 2 2009
Abstract :
The Negative-polarity Rod-pinch (NPRP) diode is being developed and tested on the RITS-6 accelerator to expand radiographic capabilities. Experimental results include shots where the diode impedance is relatively constant and the x-ray dose is as high as 175 Rad@1m with a 2.5-mm source spot size. Other shots have a rapidly decreasing diode impedance and much lower X-ray dose. Data presented here include measurements of beam current, dose rate, forward and backward directed dose, and x-ray source spot size.
Keywords :
X-ray production; pinch effect; plasma diodes; NPRP diode; RITS-6 accelerator; X-ray dose; X-ray source spot size; beam current; negative-polarity rod-pinch diode; negative-polarity rod-pinch diode experiments; radiographic capabilities; Anodes; Cathodes; Charge carrier processes; Diodes; Electrons; Geometry; Impedance; Radiography; Voltage; X-ray imaging;
Conference_Titel :
Pulsed Power Conference, 2009. PPC '09. IEEE
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-4064-1
Electronic_ISBN :
978-1-4244-4065-8
DOI :
10.1109/PPC.2009.5386338
