DocumentCode :
3204736
Title :
Noise effects in field-effect transistor biological sensor detection circuits
Author :
Cantley, Kurtis D. ; Fernandes, Poornika G. ; Zhao, Mingyue ; Stiegler, Harvey J. ; Chapman, Richard A. ; Vogel, Eric M.
Author_Institution :
Dept. of Mater. Sci. & Eng., Univ. of Texas at Dallas, Richardson, TX, USA
fYear :
2012
fDate :
5-8 Aug. 2012
Firstpage :
370
Lastpage :
373
Abstract :
Affinity-based biological sensor field-effect transistors (BioFETs) exhibit a large amount of noise in their drain current under constant bias. In this work, we use SPICE to simulate the effect of sensor noise on a differential pair amplifier detection circuit. This is accomplished by the generation of a realistic noise signal with 1/f power spectrum which is applied to the back gate and reference electrode of a nanoribbon BioFET sensor. The resulting output signal from the transient simulation is time-averaged to obtain the noise rms amplitude. The ability to distinguish the sensor signal from the noisy environment is examined for various amounts of noise power and integration time. Corresponding minimum theoretical direct detection limits for of Biotin-Streptavidin attachment and DNA hybridization are also provided, along with discussion of possible methods to reduce the noise effects.
Keywords :
SPICE; field effect transistors; sensors; DNA hybridization; SPICE; affinity based biological sensor field effect transistor; back gate; biotin streptavidin attachment; constant bias; differential pair amplifier detection circuit; direct detection limits; drain current; field effect transistor biological sensor detection circuit; integration time; nanoribbon BioFET sensor; noise effect; noise power; noisy environment; output signal; power spectrum; realistic noise signal; reference electrode; sensor noise; sensor signal; transient simulation; Biological system modeling; Biomembranes; Biosensors; Integrated circuit modeling; Logic gates; Noise; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
Conference_Location :
Boise, ID
ISSN :
1548-3746
Print_ISBN :
978-1-4673-2526-4
Electronic_ISBN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2012.6292034
Filename :
6292034
Link To Document :
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