Title :
Results of five years of module qualification testing to CEC Specification 503 [solar cell arrays]
Author :
Bishop, J. ; Ossenbrink, H.
Author_Institution :
EC DGJRC ESTI, Ispra, Italy
Abstract :
Solar cell module failures observed during qualification testing to CEC Specification 503 on 96 crystalline silicon solar cell module types are described. Of these 96 types, 22 exhibited major defects and 9 failed to meet qualification requirements. The effects of the environmental tests are presented, and used to propose test sequences for extending certification following module design changes
Keywords :
certification; elemental semiconductors; failure analysis; semiconductor device reliability; semiconductor device testing; silicon; solar cell arrays; solar cells; standards; CEC Specification 503; PV module failures; Si; crystalline Si solar cells; defects; environmental tests; qualification requirements; qualification testing; solar cell modules; Circuit testing; Crystallization; Dielectrics and electrical insulation; Electric variables measurement; IEC standards; Inspection; Insulation testing; Mechanical variables measurement; Qualifications; Silicon;
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3166-4
DOI :
10.1109/PVSC.1996.564345
