Title :
Digital circuit design for robust ultra-low-power cell library using optimum fingers
Author :
Liao, Ran ; Hutchens, Chriswell
Author_Institution :
Dept. of Electr. & Comput. Eng., Oklahoma State Univ., Stillwater, OK, USA
Abstract :
This paper presents a design methodology considering both INWE (Inverse-Narrow-Width-Effect) and RSCE (Reverse-Short-Channel-Effect) by sizing transistor´s width and length accordingly to achieve close-to-most energy-efficient digital circuit design. By using a fitted and modified INWE-aware, RSCE-aware and variation-aware model, fast estimation of width, length and nf for optimum finger can be obtained. Using such method, EDP (Energy-Delay Product) optimized gates for low-power cell library in a commercial 180nm CMOS process are developed. The proposed finger-based gates have the FO4 Delay and EDP reduced by 44%~72% and 31%~76% respectively compared with conventionally sized library gates.
Keywords :
CMOS integrated circuits; digital circuits; logic design; low-power electronics; CMOS process; EDP; FO4 delay; INWE-aware model; RSCE-aware model; digital circuit design; energy-delay product; finger-based gates; inverse-narrow-width-effect; optimum fingers; reverse-short-channel-effect; robust ultra-low-power cell library; size 180 nm; transistor length; transistor width; variation-aware model; Fingers; Geometry; Libraries; Logic gates; MOS devices; Threshold voltage; Transistors;
Conference_Titel :
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
Conference_Location :
Boise, ID
Print_ISBN :
978-1-4673-2526-4
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2012.6292053