Title :
ASIC versus antifuse FPGA reliability
Author_Institution :
Actel Corp., Mountain View, CA
Abstract :
ASICs are generally accepted as the highest reliability for custom circuits as they do not have the overhead to personalize them when compared to an FPGA. However, it is this overhead in FPGAs that allow them to be testable before personalization by the user, that makes them testable to a much higher degree than ASICs. Actual data from burn-in is compared between an ASIC and an RTAXS FPGA indicating that the FPGA is an order of magnitude more reliable than the ASIC.
Keywords :
application specific integrated circuits; field programmable gate arrays; integrated circuit reliability; integrated circuit testing; ASIC; RTAXS FPGA; antifuse FPGA reliability; burn-in; custom circuits; Application specific integrated circuits; Assembly; Circuit faults; Circuit testing; Field programmable gate arrays; Impedance; Leak detection; Life testing; Logic arrays; Military standards;
Conference_Titel :
Aerospace conference, 2009 IEEE
Conference_Location :
Big Sky, MT
Print_ISBN :
978-1-4244-2621-8
Electronic_ISBN :
978-1-4244-2622-5
DOI :
10.1109/AERO.2009.4839526
