DocumentCode
3205270
Title
ASIC versus antifuse FPGA reliability
Author
McCollum, John
Author_Institution
Actel Corp., Mountain View, CA
fYear
2009
fDate
7-14 March 2009
Firstpage
1
Lastpage
11
Abstract
ASICs are generally accepted as the highest reliability for custom circuits as they do not have the overhead to personalize them when compared to an FPGA. However, it is this overhead in FPGAs that allow them to be testable before personalization by the user, that makes them testable to a much higher degree than ASICs. Actual data from burn-in is compared between an ASIC and an RTAXS FPGA indicating that the FPGA is an order of magnitude more reliable than the ASIC.
Keywords
application specific integrated circuits; field programmable gate arrays; integrated circuit reliability; integrated circuit testing; ASIC; RTAXS FPGA; antifuse FPGA reliability; burn-in; custom circuits; Application specific integrated circuits; Assembly; Circuit faults; Circuit testing; Field programmable gate arrays; Impedance; Leak detection; Life testing; Logic arrays; Military standards;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace conference, 2009 IEEE
Conference_Location
Big Sky, MT
Print_ISBN
978-1-4244-2621-8
Electronic_ISBN
978-1-4244-2622-5
Type
conf
DOI
10.1109/AERO.2009.4839526
Filename
4839526
Link To Document