• DocumentCode
    3205530
  • Title

    Efficient fault emulation based on post-injection fault effect analysis (PIFEA)

  • Author

    Grinschgl, Johannes ; Krieg, Armin ; Steger, Christian ; Weiss, Reinhold ; Bock, Holger ; Haid, Josef

  • Author_Institution
    Inst. for Tech. Inf., Graz Univ. of Technol., Graz, Austria
  • fYear
    2012
  • fDate
    5-8 Aug. 2012
  • Firstpage
    526
  • Lastpage
    529
  • Abstract
    Over the last years the complexity of SoC´s has increased enormously. This increase leads to a high test effort against faults. Therefore, methods have been developed to speed-up fault testing to cope with the increasing number of possible faults. One method is to emulate fault attacks. To cope with the large amount of test data a method to check automatically if a fault injection was successful is required. In this paper a novel method is presented how automatically, on a fault emulation platform, can be proven if a fault forces the system to unintended behavior. The PIFEA hardware block is designed to check if the system execution flow is manipulated or if the system detects the fault and switches in a secure mode.
  • Keywords
    fault diagnosis; system-on-chip; PIFEA hardware block; SoC; fault emulation platform; post-injection fault effect analysis; speed-up fault testing; test data; Emulation; Field programmable gate arrays; Hardware; Radiation detectors; Security; System-on-a-chip; Testing; automatic test pattern injection; fault emulation; fault injection controller; multi-bit faults; saboteurs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
  • Conference_Location
    Boise, ID
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4673-2526-4
  • Electronic_ISBN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2012.6292073
  • Filename
    6292073