DocumentCode :
3205530
Title :
Efficient fault emulation based on post-injection fault effect analysis (PIFEA)
Author :
Grinschgl, Johannes ; Krieg, Armin ; Steger, Christian ; Weiss, Reinhold ; Bock, Holger ; Haid, Josef
Author_Institution :
Inst. for Tech. Inf., Graz Univ. of Technol., Graz, Austria
fYear :
2012
fDate :
5-8 Aug. 2012
Firstpage :
526
Lastpage :
529
Abstract :
Over the last years the complexity of SoC´s has increased enormously. This increase leads to a high test effort against faults. Therefore, methods have been developed to speed-up fault testing to cope with the increasing number of possible faults. One method is to emulate fault attacks. To cope with the large amount of test data a method to check automatically if a fault injection was successful is required. In this paper a novel method is presented how automatically, on a fault emulation platform, can be proven if a fault forces the system to unintended behavior. The PIFEA hardware block is designed to check if the system execution flow is manipulated or if the system detects the fault and switches in a secure mode.
Keywords :
fault diagnosis; system-on-chip; PIFEA hardware block; SoC; fault emulation platform; post-injection fault effect analysis; speed-up fault testing; test data; Emulation; Field programmable gate arrays; Hardware; Radiation detectors; Security; System-on-a-chip; Testing; automatic test pattern injection; fault emulation; fault injection controller; multi-bit faults; saboteurs;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
Conference_Location :
Boise, ID
ISSN :
1548-3746
Print_ISBN :
978-1-4673-2526-4
Electronic_ISBN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2012.6292073
Filename :
6292073
Link To Document :
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