Title : 
An effective solution to thermal-aware test scheduling on network-on-chip using multiple clock rates
         
        
            Author : 
Salamy, Hassan ; Harmanani, Haidar
         
        
            Author_Institution : 
Ingram Sch. of Eng., Texas State Univ., San Marcos, TX, USA
         
        
        
        
        
        
            Abstract : 
As more cores are being packed on a single chip, bus-based communication is suffering from bandwidth and scalability issues. As a result, the new approach is to use a network-on-chip (NoC) as the main communication platform on a SoC. NoC provides the flexibility and scalability much needed in the era of multi-cores. NoC-based systems also provide the capability of multiple clocking that is widely used in many SoC nowadays. In this paper, a simulated annealing algorithm for thermal and power-aware test scheduling of cores in a NoC-based SoC using multiple clock rates is presented. Results on different benchmarks show the effectiveness of our technique.
         
        
            Keywords : 
circuit testing; clocks; network-on-chip; scheduling; NoC; SoC; bandwidth issues; bus-based communication; multiple clock rates; network-on-chip; scalability issues; system-on-chip; thermal-aware test scheduling; Benchmark testing; Clocks; Safety; Schedules; Scheduling; System-on-a-chip;
         
        
        
        
            Conference_Titel : 
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
         
        
            Conference_Location : 
Boise, ID
         
        
        
            Print_ISBN : 
978-1-4673-2526-4
         
        
            Electronic_ISBN : 
1548-3746
         
        
        
            DOI : 
10.1109/MWSCAS.2012.6292074