DocumentCode
3205568
Title
Estimating service lifetimes of a polymer encapsulant for photovoltaic modules from accelerated testing
Author
Czanderna, A.W. ; Pern, F.J.
Author_Institution
Nat. Renewable Energy Lab., Golden, CO, USA
fYear
1996
fDate
13-17 May 1996
Firstpage
1219
Lastpage
1222
Abstract
In this paper, most of the emphasis is on A9918 ethylene vinyl acetate (EVA) used commercially as the pottant for encapsulating photovoltaic (PV) modules, in which the efficiencies in field-deployed modules have been reduced by 10-70% in 4-12 years. Yet, projections were made by several different research groups in the 1980s that the EVA lifetime could range from 2-100 years. The authors: (1) elucidate the complexity of the encapsulation problem; (2) indicate the performance losses reported for PV systems deployed since 1981; (3) critically assess the service lifetime predictions for EVA as a PV pottant based on studies by others for which they review the inherent errors in their assumptions about the Arrhenius relation; (4) show how degradation of minimodules in laboratory experiments that simulate reality can produce efficiency losses comparable to those in field-degraded PV modules reported in the literature; and (5) outline an acceptable methodology for making a service lifetime prediction of the polymer encapsulant, including the essential need for relating accelerated lifetime testing to real-time testing with a sufficient number of samples
Keywords
electric breakdown; encapsulation; insulation testing; life testing; organic insulating materials; polymers; semiconductor device packaging; semiconductor device testing; solar cell arrays; solar cells; A9918 ethylene vinyl acetate; Arrhenius relation; EVA lifetime; PV module encapsulation; PV pottant; accelerated testing; field-deployed modules; laboratory experiments; performance losses; polymer encapsulant; service lifetime estimation; Encapsulation; Life estimation; Life testing; Lifetime estimation; Performance loss; Photovoltaic systems; Polymers; Solar power generation; System testing; Thermal degradation;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location
Washington, DC
ISSN
0160-8371
Print_ISBN
0-7803-3166-4
Type
conf
DOI
10.1109/PVSC.1996.564351
Filename
564351
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