Title :
Majority voter: Signal probability, reliability and error bound characteristics
Author :
Ban, Tian ; De Barros Naviner, Lirida Alves
Author_Institution :
Inst. Mines-TELECOM, TELECOM-ParisTech, Paris, France
Abstract :
The importance of reliability in majority voter is due to its application in both conventional fault-tolerant design and novel nanoelectronic systems. A better understanding of signal probability, functional/signal reliability and error bound of majority voter is discussed in this paper. We analyze these parameters by boolean difference. The equations derived in this paper present the characteristics of error propagations in majority voter, and reveal the conditions that TMR (Triple Module Redundancy) technique requires. The results show the critical importance of error characteristics of majority voter, as used in fault-tolerant designs.
Keywords :
Boolean functions; fault tolerance; nanoelectronics; signal processing; Boolean difference; TMR; error bound characteristics; error propagations; fault-tolerant design; functional/signal reliability; majority voter; nanoelectronic systems; signal probability; triple module redundancy technique; Circuit faults; Error probability; Fault tolerance; Integrated circuit reliability; Logic gates; Tunneling magnetoresistance;
Conference_Titel :
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
Conference_Location :
Boise, ID
Print_ISBN :
978-1-4673-2526-4
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2012.6292076