DocumentCode
3205571
Title
Majority voter: Signal probability, reliability and error bound characteristics
Author
Ban, Tian ; De Barros Naviner, Lirida Alves
Author_Institution
Inst. Mines-TELECOM, TELECOM-ParisTech, Paris, France
fYear
2012
fDate
5-8 Aug. 2012
Firstpage
538
Lastpage
541
Abstract
The importance of reliability in majority voter is due to its application in both conventional fault-tolerant design and novel nanoelectronic systems. A better understanding of signal probability, functional/signal reliability and error bound of majority voter is discussed in this paper. We analyze these parameters by boolean difference. The equations derived in this paper present the characteristics of error propagations in majority voter, and reveal the conditions that TMR (Triple Module Redundancy) technique requires. The results show the critical importance of error characteristics of majority voter, as used in fault-tolerant designs.
Keywords
Boolean functions; fault tolerance; nanoelectronics; signal processing; Boolean difference; TMR; error bound characteristics; error propagations; fault-tolerant design; functional/signal reliability; majority voter; nanoelectronic systems; signal probability; triple module redundancy technique; Circuit faults; Error probability; Fault tolerance; Integrated circuit reliability; Logic gates; Tunneling magnetoresistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
Conference_Location
Boise, ID
ISSN
1548-3746
Print_ISBN
978-1-4673-2526-4
Electronic_ISBN
1548-3746
Type
conf
DOI
10.1109/MWSCAS.2012.6292076
Filename
6292076
Link To Document