• DocumentCode
    3205571
  • Title

    Majority voter: Signal probability, reliability and error bound characteristics

  • Author

    Ban, Tian ; De Barros Naviner, Lirida Alves

  • Author_Institution
    Inst. Mines-TELECOM, TELECOM-ParisTech, Paris, France
  • fYear
    2012
  • fDate
    5-8 Aug. 2012
  • Firstpage
    538
  • Lastpage
    541
  • Abstract
    The importance of reliability in majority voter is due to its application in both conventional fault-tolerant design and novel nanoelectronic systems. A better understanding of signal probability, functional/signal reliability and error bound of majority voter is discussed in this paper. We analyze these parameters by boolean difference. The equations derived in this paper present the characteristics of error propagations in majority voter, and reveal the conditions that TMR (Triple Module Redundancy) technique requires. The results show the critical importance of error characteristics of majority voter, as used in fault-tolerant designs.
  • Keywords
    Boolean functions; fault tolerance; nanoelectronics; signal processing; Boolean difference; TMR; error bound characteristics; error propagations; fault-tolerant design; functional/signal reliability; majority voter; nanoelectronic systems; signal probability; triple module redundancy technique; Circuit faults; Error probability; Fault tolerance; Integrated circuit reliability; Logic gates; Tunneling magnetoresistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
  • Conference_Location
    Boise, ID
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4673-2526-4
  • Electronic_ISBN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2012.6292076
  • Filename
    6292076