Title :
Electromagnetic dot sensor - calibration
Author :
Al Agry, A. ; Schill, R.A., Jr. ; Garner, S. ; Andersen, S. ; Buchanan, K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Nevada Las Vegas, Las Vegas, NV, USA
fDate :
June 28 2009-July 2 2009
Abstract :
The recently patented UNLV electromagnetic (EM) dot sensor measures the rate of change of the electric flux density and the magnetic flux density at the same point in space simultaneously over time. This single device performs the function of two to four sensors distributed in space. The calibration setup of the EM-dot is presented ultimately leading to a pair of calibration factors.
Keywords :
calibration; electric field measurement; electric sensing devices; electromagnetic devices; magnetic field measurement; magnetic flux; magnetic sensors; EM-dot sensor; calibration; electric flux density; electromagnetic dot sensor; magnetic flux density; single device; Calibration; EMP radiation effects; Electromagnetic transients; Magnetic field measurement; Magnetic sensors; Monitoring; Probes; Pulse measurements; Resistors; Voltage;
Conference_Titel :
Pulsed Power Conference, 2009. PPC '09. IEEE
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-4064-1
Electronic_ISBN :
978-1-4244-4065-8
DOI :
10.1109/PPC.2009.5386391
