DocumentCode :
3205670
Title :
Nondestructive reverse engineering of trace maps in multilayered PCBs
Author :
Longbotham, Harold G. ; Yan, Ping ; Kothari, Hemal N. ; Zhou, Jun
Author_Institution :
Conceptual MindWorks Inc., San Antonio, TX, USA
fYear :
1995
fDate :
8-10 Aug. 1995
Firstpage :
390
Lastpage :
397
Abstract :
The focus of this paper is on separating the layers of an unpopulated, two layered circuit card assemblies/printed circuit boards (CCA/PCB) using X-ray stereo imaging. By separating the layers, we mean that our desire is to separate the traces on each layer of any multi-layered CCA. The final end product is envisioned to be an interactive, automated trace reconstruction system which will separate individual trace layers on a multi-layered PCB. Some of the benefits of such a system are: (1) eliminates the need to have prior knowledge of the CCA via examination of its engineering data; (2) the system can be generalized to different types of CCA´s which have different number of trace layers, without any modification to the software; (3) allow the examination of each trace layer of a (multi-layered) CCA separately; (4) a non-intrusive technique which would not subject the CCA to any electronic stimulation.
Keywords :
X-ray imaging; automatic optical inspection; automatic test software; edge detection; feature extraction; image matching; image reconstruction; printed circuit manufacture; printed circuit testing; reverse engineering; soldering; stereo image processing; X-ray stereo imaging; circuit card assemblies; correspondence problem; edge extraction; interactive automated trace reconstruction system; multilayered PCB; nondestructive reverse engineering; pre-filtering; solder joints; stereo matching; trace filling; trace maps; two layered; Adaptive signal processing; Assembly; Data mining; Electrical engineering; Electronic mail; Feature extraction; Layout; Printed circuits; Reverse engineering; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-2621-0
Type :
conf
DOI :
10.1109/AUTEST.1995.522701
Filename :
522701
Link To Document :
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