• DocumentCode
    3205670
  • Title

    Nondestructive reverse engineering of trace maps in multilayered PCBs

  • Author

    Longbotham, Harold G. ; Yan, Ping ; Kothari, Hemal N. ; Zhou, Jun

  • Author_Institution
    Conceptual MindWorks Inc., San Antonio, TX, USA
  • fYear
    1995
  • fDate
    8-10 Aug. 1995
  • Firstpage
    390
  • Lastpage
    397
  • Abstract
    The focus of this paper is on separating the layers of an unpopulated, two layered circuit card assemblies/printed circuit boards (CCA/PCB) using X-ray stereo imaging. By separating the layers, we mean that our desire is to separate the traces on each layer of any multi-layered CCA. The final end product is envisioned to be an interactive, automated trace reconstruction system which will separate individual trace layers on a multi-layered PCB. Some of the benefits of such a system are: (1) eliminates the need to have prior knowledge of the CCA via examination of its engineering data; (2) the system can be generalized to different types of CCA´s which have different number of trace layers, without any modification to the software; (3) allow the examination of each trace layer of a (multi-layered) CCA separately; (4) a non-intrusive technique which would not subject the CCA to any electronic stimulation.
  • Keywords
    X-ray imaging; automatic optical inspection; automatic test software; edge detection; feature extraction; image matching; image reconstruction; printed circuit manufacture; printed circuit testing; reverse engineering; soldering; stereo image processing; X-ray stereo imaging; circuit card assemblies; correspondence problem; edge extraction; interactive automated trace reconstruction system; multilayered PCB; nondestructive reverse engineering; pre-filtering; solder joints; stereo matching; trace filling; trace maps; two layered; Adaptive signal processing; Assembly; Data mining; Electrical engineering; Electronic mail; Feature extraction; Layout; Printed circuits; Reverse engineering; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
  • Conference_Location
    Atlanta, GA, USA
  • Print_ISBN
    0-7803-2621-0
  • Type

    conf

  • DOI
    10.1109/AUTEST.1995.522701
  • Filename
    522701