Title :
A design technique overview on broadband RF ESD protection circuit designs
Author :
Li Wang ; Ma, Rui ; Wang, Albert ; Wang, Xin ; Yue, Patrick ; Xin Wang ; Zhao, Bin ; Shi, Zitao ; Cheng, Yuhua
Author_Institution :
Dept. of EE, Univ. of California, Riverside, CA, USA
Abstract :
This paper presents an overview of the co-design technique for broadband RF ESD protection circuit designs. The unique mixed-mode ESD simulation design methodology allows full-chip design optimization and prediction of broadband RF ICs with full low-parasitic ESD protection, which were validated experimentally using ultra wideband (UWB) RF ICs and RF switch circuits in CMOS technologies.
Keywords :
CMOS digital integrated circuits; circuit optimisation; electrostatic discharge; integrated circuit design; radiofrequency integrated circuits; ultra wideband technology; CMOS technologies; RF switch circuits; UWB RF IC; broadband RF ESD protection circuit designs; broadband RF IC prediction; codesign technique; full low-parasitic ESD protection; full-chip design optimization; ultra wideband RF IC; unique mixed-mode ESD simulation design; Broadband communication; Electrostatic discharges; Integrated circuit modeling; Noise measurement; Radio frequency; Switching circuits;
Conference_Titel :
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
Conference_Location :
Boise, ID
Print_ISBN :
978-1-4673-2526-4
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2012.6292089
