DocumentCode :
3205917
Title :
An on-chip inductive impedance measurement method with adaptive measurement range control for MWM-array based NDE applications
Author :
Shi, Yulong ; Chen, Degang
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
fYear :
2012
fDate :
5-8 Aug. 2012
Firstpage :
618
Lastpage :
621
Abstract :
Motivated by emerging meandering winding magnetometer (MWM) array based Non-Destructive Evaluation (NDE) applications, this paper presents a new approach for on-chip inductive impedance measurement to enable MWM-array applications to be happened in field, in real-time, and during targets´ operation. Different from state of art solutions which rely on high precision analog processing functions to achieve high accuracy, the proposed approach innovatively incorporate bridge circuit, feedback, and resonance concepts to achieve impedance measurement on a single chip. Behavior level simulation demonstrated the measurement algorithm and feasibility of the proposed method.
Keywords :
bridge circuits; circuit feedback; electric impedance measurement; magnetometers; nondestructive testing; system-on-chip; MWM-array applications; NDE applications; adaptive measurement range control; feedback; high precision analog processing functions; innovatively incorporate bridge circuit; meandering winding magnetometer array; nondestructive evaluation applications; on-chip inductive impedance measurement method; resonance concepts; state of art solutions; Arrays; Capacitors; Impedance; Impedance measurement; Sensors; System-on-a-chip; Tuning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
Conference_Location :
Boise, ID
ISSN :
1548-3746
Print_ISBN :
978-1-4673-2526-4
Electronic_ISBN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2012.6292096
Filename :
6292096
Link To Document :
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