Title :
Study and characterization of lunar craters using Mini-SAR data of Chandrayaan-1
Author :
Mishra, P. ; Rajashekhar, U. ; Singh, D.
Author_Institution :
Dept. of Electron. & Commun. Eng., Indian Inst. of Technol. Roorkee, Roorkee, India
Abstract :
Analyzing lunar surface with various approaches is still a very challenging task. Therefore, in this paper, an attempt has been made to critically analyze the lunar surface by using various approaches so that the possibility of water ice can be predicted. The polarimetric approach helps in determining physical and electrical properties of target. The polarimetric approaches, `m-δ´ decomposition [1, 2] and `m-χ´ decomposition [3], have been used for obtaining the information of scattering mechanisms. In order to determine electrical properties of lunar surface, dielectric constant has been measured using Campbell´s approach [4]. Then, specular diffuse model [5] has been applied for identifying various craters with reference to surface roughness and possibility of water-ice deposits.
Keywords :
astronomical instruments; dielectric measurement; dielectric properties; electromagnetic wave scattering; ice; lunar surface; radar polarimetry; remote sensing by radar; surface roughness; synthetic aperture radar; CHANDRAYAAN-l; Campbell approach; dielectric constant measurement; electrical properties; lunar crater characterization; lunar surface analysis; m-δ decomposition; m-χ decomposition; mini-SAR data; polarimetric approach; scattering mechanisms; surface roughness; water-ice deposit possibility; Ice; Radio frequency; Remote sensing; Rough surfaces; Scattering; Stokes parameters; Surface roughness;
Conference_Titel :
Microwave and Photonics (ICMAP), 2013 International Conference on
Conference_Location :
Dhanbad
Print_ISBN :
978-1-4799-2176-8
DOI :
10.1109/ICMAP.2013.6733449