• DocumentCode
    3206361
  • Title

    Classification of EEG bursts in deep sevoflurane, desflurane and isoflurane anesthesia using AR-modeling and entropy measures

  • Author

    Lipping, Tarmo ; Stalnacke, Juha ; Olejarczyk, Elzbieta ; Marciniak, Radoslaw ; Jantti, Ville

  • Author_Institution
    Pori Dept., Tampere Univ. of Technol., Pori, Finland
  • fYear
    2013
  • fDate
    3-7 July 2013
  • Firstpage
    5083
  • Lastpage
    5086
  • Abstract
    A study relating signal patterns of burst onsets in burst suppression EEG to the anesthetic agent or anesthesia induction protocol is presented. A dataset of 82 recordings of sevoflurane, isoflurane and desflurane anesthesia underlies the study. 3 second segments from the onset of altogether 3214 bursts are described using AR model parameters, spectral entropy and sample entropy as features. The features are clustered using the K-means algorithm. The results indicate that no clear cut distinction can be made between the burst patterns induced by the mentioned anesthetics although bursts of certain properties are more common in certain patient groups. Several directions for further investigations are proposed based on visual inspection of the recordings.
  • Keywords
    burst noise; drugs; electroencephalography; entropy; medical signal processing; signal classification; spectral analysis; AR model parameter; AR-modeling; EEG burst classification; K-means algorithm; anesthesia induction protocol; anesthetic agent induction protocol; burst onset signal pattern; burst pattern distinction; burst suppression EEG; deep sevoflurane anesthesia; desflurane anesthesia; entropy measure; feature clustering; isoflurane anesthesia; onset segment; recording visual inspection; sample entropy; spectral entropy; time 3 s; Anesthesia; Brain modeling; Clustering algorithms; Drugs; Electroencephalography; Entropy; Protocols;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
  • Conference_Location
    Osaka
  • ISSN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2013.6610691
  • Filename
    6610691