Title :
Punch-through Behaviour Of FOXFET Biased Detectors
Author :
Bacchetta, N. ; Bisello, D. ; Ros, R. Da ; Giraldo, A. ; Gotra, Yu ; Paccagnella, A. ; Verzellesi, G.
Author_Institution :
INFN
fDate :
31 Oct-6 Nov 1993
Keywords :
Electric resistance; Leak detection; Microstrip; Neutrons; Radiation detectors; Semiconductor device doping; Silicon; Strips; Temperature dependence; Testing;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1993., 1993 IEEE Conference Record.
Print_ISBN :
0-7803-1487-5
DOI :
10.1109/NSSMIC.1993.701652
