• DocumentCode
    3206392
  • Title

    Punch-through Behaviour Of FOXFET Biased Detectors

  • Author

    Bacchetta, N. ; Bisello, D. ; Ros, R. Da ; Giraldo, A. ; Gotra, Yu ; Paccagnella, A. ; Verzellesi, G.

  • Author_Institution
    INFN
  • fYear
    1993
  • fDate
    31 Oct-6 Nov 1993
  • Firstpage
    53
  • Lastpage
    57
  • Keywords
    Electric resistance; Leak detection; Microstrip; Neutrons; Radiation detectors; Semiconductor device doping; Silicon; Strips; Temperature dependence; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference, 1993., 1993 IEEE Conference Record.
  • Print_ISBN
    0-7803-1487-5
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1993.701652
  • Filename
    701652
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3206392