• DocumentCode
    3206497
  • Title

    Ultrasonic inspection of foundry pieces applying wavelet transform analysis

  • Author

    Serrano, I. ; Lázaro, A. ; Oria, J.P.

  • Author_Institution
    Dept. of Electron. Technol. & Autom. Syst., Cantabria Univ., Santander, Spain
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    375
  • Lastpage
    380
  • Abstract
    Object identification techniques are finding increasing use in many industrial applications. A defect recognition method for foundry pieces in this field is proposed. The system classifies the pieces and selects the apt ones, which will later be machined within the automobile industry. The inspection of the pieces is carried out applying ultrasonic sensing. Due to the ultrasound properties, this type of vision is very appropriate for industrial environments. Starting from the signal reflected from the pieces, the treatment of the data is approached in two significant steps. First, the discrete wavelet transform, DWT, is applied to the analysis of ultrasonic waves for feature extraction. Second, a neural network is used to carry out the discrimination of the foundry pieces. This automated signal classification system obtains great results and the use of the tandem DWT analysis-neural network is shown to be a powerful technique for this type of application
  • Keywords
    discrete wavelet transforms; feature extraction; feedforward neural nets; filtering theory; inspection; object recognition; signal classification; ultrasonic applications; automated signal classification system; defect recognition method; discrete wavelet transform; foundry pieces; object identification techniques; ultrasonic inspection; ultrasonic sensing; wavelet transform analysis; Automobiles; Discrete wavelet transforms; Feature extraction; Foundries; Inspection; Neural networks; Pattern classification; Ultrasonic imaging; Wavelet analysis; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Control/Intelligent Systems and Semiotics, 1999. Proceedings of the 1999 IEEE International Symposium on
  • Conference_Location
    Cambridge, MA
  • ISSN
    2158-9860
  • Print_ISBN
    0-7803-5665-9
  • Type

    conf

  • DOI
    10.1109/ISIC.1999.796684
  • Filename
    796684