Title :
Data Analysis of Electrical Performance Measurements from 15 Years of Module Qualification Tests
Author :
Sample, T. ; Skoczek, A. ; Dunlop, E.D. ; Ossenbrink, H.A.
Author_Institution :
DG Joint Res. Centre IES, Eur. Comm., Ispra
Abstract :
Qualification tests of terrestrial photovoltaic (PV) modules have been carried out at the European solar test installation of the European Commission´s Joint research centre, Ispra from 1981. Since 1990, all tests have been based on the IEC 61215 Standard, or its direct predecessor, Specification 503 [1] The performance measurements on all of these modules now form an extensive database of results for electric performance degradation, after applied qualification tests. Many of the stress tests results obtained by the ESTI Laboratory have already been published and presented [2] [3].This paper presents statistical analysis of selected results of the behavior of crystalline silicon modules from the data base of modules tested from 1990 up to 2006
Keywords :
IEC standards; elemental semiconductors; silicon; solar cells; statistical analysis; ESTI Laboratory; European Commission´s Joint research centre; European solar test installation; IEC 61215 Standard; Ispra; Si; crystalline silicon modules; electrical performance measurement; module qualification test; statistical analysis; terrestrial photovoltaic data analysis; Data analysis; Databases; Degradation; IEC standards; Measurement standards; Photovoltaic systems; Qualifications; Solar power generation; Stress; Testing;
Conference_Titel :
Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
1-4244-0016-3
Electronic_ISBN :
1-4244-0017-1
DOI :
10.1109/WCPEC.2006.279903