• DocumentCode
    3207021
  • Title

    Quality monitoring technology for laser welding

  • Author

    Takanohashi, Yukio ; Kimura, Seiichiro ; Sameda, Yoshito ; Miyahara, Kunio

  • Author_Institution
    Heavy Apparatus Eng. Lab., Toshiba Corp., Tokyo, Japan
  • Volume
    2
  • fYear
    1995
  • fDate
    6-10 Nov 1995
  • Firstpage
    1164
  • Abstract
    The possibilities of laser welding quality monitoring by evaluating the plasma which appears on the surface of the metal is considered in this paper. As one of the results, it is found that the size of the laser induced plasma changes at a period of ms order. It also becomes clear that there is a linear correlation between both of the signal levels of the charge voltage caused by the laser induced plasma and plasma radiation, and the penetration depth of laser welding on the workpiece. Also, since this charge voltage changes when a humping bead occurs, it is promised that those welding instabilities which occur at low power densities can be detected by the plasma charge voltage monitoring method
  • Keywords
    charge measurement; electric charge; laser beam welding; monitoring; plasma diagnostics; quality control; voltage measurement; charge voltage measurement; humping bead; laser induced plasma; laser welding; linear correlation; penetration depth; plasma radiation; power densities; quality monitoring technology; signal levels; welding instabilities; workpiece; Cameras; Charge measurement; Current measurement; Monitoring; Plasma devices; Plasma measurements; Plasma stability; Plasma welding; Power lasers; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, Control, and Instrumentation, 1995., Proceedings of the 1995 IEEE IECON 21st International Conference on
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-3026-9
  • Type

    conf

  • DOI
    10.1109/IECON.1995.483961
  • Filename
    483961