Title :
A novel thermal calibration technique for electronic module inspection using an optical image
Author :
Zandhuis, J.A. ; Pycock, D. ; Quigely, S.F. ; Webb, P.W.
Author_Institution :
Sch. of Electron. & Electr. Eng., Birmingham Univ., UK
Abstract :
We propose a fast thermal calibration process that uses optical imaging to identify the materials present. We demonstrate how materials are uniquely identified i) in colour and ii) in thermal emissivity
Keywords :
automatic optical inspection; colour; electronic module inspection; optical imaging; thermal calibration; thermal emissivity;
Conference_Titel :
Industrial Inspection (Digest No: 1997/041), IEE Colloquium on
Conference_Location :
London
DOI :
10.1049/ic:19970260
