Title :
Nonlinear analysis of f/sub 0//2 loop oscillation of high power amplifiers
Author :
Mochizuki, Marie ; Nakayama, Makoto ; Tarui, Yoichiro ; Itoh, Yoshio ; Tsuji, Satoshi ; Takagi, Toshiyuki
Author_Institution :
Electro-Opt. & Microwave Syst. Lab., Mitsubishi Electr. Corp., Kanagawa, Japan
Abstract :
A novel nonlinear analysis of high power amplifier instability has been developed. This analysis method deals with a loop oscillation and presents the conditions for oscillation under large-signal operation by taking account of a mixing effect of FETs. Applying this analysis method to the high power amplifier instability that an output power decreases at some compression point where an f/sub 0//2-wave is observed, it has been found that this instability is caused by an f/sub 0//2 loop oscillation. In addition, it has been verified by analysis and measurement that the oscillation can be removed by employing an isolation resistor in a closed loop circuit.<>
Keywords :
circuit oscillations; circuit stability; microwave power amplifiers; nonlinear network analysis; FET mixing effect; amplifier instability; closed loop circuit; f/sub 0//2 loop oscillation; high power amplifiers; isolation resistor; large-signal operation; nonlinear analysis; FETs; High power amplifiers; Laboratories; Microwave amplifiers; Microwave communication; Power amplifiers; Power generation; Power measurement; Resistors; Solid state circuits;
Conference_Titel :
Microwave Symposium Digest, 1995., IEEE MTT-S International
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-2581-8
DOI :
10.1109/MWSYM.1995.406009
