DocumentCode :
3207086
Title :
Uncertainty Estimate of Photovoltaic Module Power Rating for Outdoor Testing
Author :
Atmaram, Gobind H.
Author_Institution :
Florida Solar Energy Center, Cocoa, FL
Volume :
2
fYear :
2006
fDate :
7-12 May 2006
Firstpage :
2124
Lastpage :
2128
Abstract :
The Florida Solar Energy Center (FSEC) operates photovoltaic testing and certification program accredited by the American Association for Laboratory Accreditation (A2LA) and approved by the PowerMark Corporation (PMC). The photovoltaic (PV) module power rating certification is central to the FSEC program, as it is also required for the PV system design approval. A quality or accredited testing laboratory is required to provide its clientele with estimates of measurement uncertainties to assure testing quality and express the confidence of the reported results. These are also the specific requirements of the ISO standard 17025, A2LA accreditation and PMC approval. The FSEC PV testing laboratory has performed the detailed analysis of the uncertainty estimates in PV module power ratings and related parameters. This paper discusses the general procedure for estimating the measurement uncertainty and its application to develop formulation for the uncertainty in PV module power rating under outdoor testing, followed by an example of uncertainty estimates at the FSEC PV test laboratory
Keywords :
ISO standards; calibration; measurement uncertainty; solar cells; American Association for Laboratory Accreditation; FSEC PV testing laboratory; Florida solar energy center; ISO standard 17025; ISO standard A2LA; PowerMark Corporation; measurement uncertainties; outdoor testing; photovoltaic module; photovoltaic testing-certification program; power rating; testing quality; Accreditation; Certification; ISO standards; Laboratories; Measurement uncertainty; Performance evaluation; Photovoltaic systems; Solar energy; Solar power generation; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
1-4244-0016-3
Electronic_ISBN :
1-4244-0017-1
Type :
conf
DOI :
10.1109/WCPEC.2006.279924
Filename :
4060090
Link To Document :
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