DocumentCode :
3207180
Title :
An Evaluation of 27+ Years Old Photovoltaic Modules Operated in a Hot-Desert Climatic Condition
Author :
Tang, Yingtang ; Raghuraman, Bindhu ; Kuitche, Joseph ; TamizhMani, Govindasamy ; Backus, Charles E. ; Osterwald, Carl
Author_Institution :
Photovoltaic Testing Lab., Arizona State Univ., Mesa, AZ
Volume :
2
fYear :
2006
fDate :
7-12 May 2006
Firstpage :
2145
Lastpage :
2147
Abstract :
Identification of failure mechanisms from the long-term field deployed modules is of great importance to the photovoltaic industry. This paper investigates the modules removed from a water pumping array operated over 27+ years in a hot-desert climatic condition, Arizona. Thirty-two modules were evaluated in this investigation. Each module is comprised of silicone rubber superstrate/encapsulant, mono-Si cells, fiberglass-like substrate, potted junction box and neoprene cable. Ten of these thirty-two modules were either non-functional or near non-functional with less than 30% of the original power. The other twenty-two functional modules showed an average power degradation of 1.08% per year over 27 years of operation. After the damp-heat (1000 hours of 85degC/85%RH), thermal cycling (two-hundred cycles of 90degC/-40degC) and hot-spot stress tests the modules lost about 11%, 9.8% and 3.5% of power, respectively
Keywords :
environmental factors; failure analysis; life testing; solar cells; -40 C; 1000 hours; 85 C; 90 C; average power degradation; damp-heat; encapsulant; failure mechanism identification; fiberglass-like substrate; hot-desert climatic condition; hot-spot stress tests; long-term field deployed modules; monoSi cells; neoprene cable; photovoltaic modules; potted junction box; silicone rubber superstrate; thermal cycling test; water pumping array; Failure analysis; IEC standards; Laboratories; Manufacturing; Optical fiber cables; Photovoltaic systems; Qualifications; Solar power generation; Testing; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
1-4244-0016-3
Electronic_ISBN :
1-4244-0017-1
Type :
conf
DOI :
10.1109/WCPEC.2006.279929
Filename :
4060095
Link To Document :
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