Title :
Built-in test maturation concepts using test program set and relational database technologies
Author :
Sudolsky, Michael D.
Author_Institution :
C-17 Autom. Test Syst., McDonnell Douglas Aerosp., Long Beach, CA, USA
Abstract :
Continual improvement of avionic built-in test (BIT) is critical to mission readiness and capability. This paper discusses how test program set (TPS) and relational database (RDB) technologies can be used for this purpose. Important aspects for continually improving avionic BIT and TPS operation are discussed.
Keywords :
aircraft computers; aircraft testing; automatic test software; built-in self test; fault diagnosis; integrated software; military aircraft; military avionics; military computing; relational databases; ATE; TPS BIT shell; avionic built-in test; built-in test maturation; hybrid shell; military avionics; mission readiness; relational database; test program set; Aerospace electronics; Aerospace testing; Automatic testing; Built-in self-test; Circuit testing; Costs; Displays; Military aircraft; Relational databases; System testing;
Conference_Titel :
AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-2621-0
DOI :
10.1109/AUTEST.1995.522711
