Title :
Forensic characterization of RF devices
Author :
Mikkilineni, Aravind K. ; King-Smith, Deen ; Gelfand, Saul B. ; Delp, Edward J.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
We present a framework for forensic identification of RF devices using specially designed probe signals. This framework applies to a broad range of devices. Probe signals, device models, feature selection and classifier design are described, and experimental results are given to verify our approach.
Keywords :
failure analysis; radio applications; RF devices; classifier design; device models; feature selection; forensic characterization; forensic identification; probe signals; Chirp; Circuits; Filters; Fingerprint recognition; Forensics; Frequency estimation; Probes; RF signals; Radio frequency; Signal design;
Conference_Titel :
Information Forensics and Security, 2009. WIFS 2009. First IEEE International Workshop on
Conference_Location :
London
Print_ISBN :
978-1-4244-5279-8
Electronic_ISBN :
978-1-4244-5280-4
DOI :
10.1109/WIFS.2009.5386490
