• DocumentCode
    3207770
  • Title

    Tevatron Admittance Measurement

  • Author

    Zhang, X.L. ; Shiltsev, V. ; Tan, C.Y.

  • Author_Institution
    FNAL, Batavia, IL 60510, USA
  • fYear
    2005
  • fDate
    16-20 May 2005
  • Firstpage
    2306
  • Lastpage
    2308
  • Abstract
    We measured the Tevatron beam admittance by the means of exciting the beam with noise and causing emittance growth. The noise power was about 3W with a bandwidth of 100Hz and centered either in the horizontal betatron frequency or vertical betatron frequency. We were able to controllably blow the beam emittance up quickly. From the point where the beam emittance stopped growing, we measured the beam acceptance of the Tevatron.
  • Keywords
    Admittance measurement; Apertures; Bandwidth; Extraterrestrial measurements; Frequency; Noise measurement; Particle beam measurements; Particle beams; Protons; Stripline;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 2005. PAC 2005. Proceedings of the
  • Print_ISBN
    0-7803-8859-3
  • Type

    conf

  • DOI
    10.1109/PAC.2005.1591092
  • Filename
    1591092
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3207770