Title :
Classification of diffuse lung diseases patterns by a sparse representation based method on HRCT images
Author :
Wei Zhao ; Rui Xu ; Hirano, Yoshikuni ; Tachibana, Ryoichi ; Kido, S.
Author_Institution :
Appl. Med. Eng. Sci., Yamaguchi Univ., Ube, Japan
Abstract :
This paper describes a computer-aided diagnosis (CAD) method to classify diffuse lung diseases (DLD) patterns on HRCT images. Due to the high variety and complexity of DLD patterns, the performance of conventional methods on recognizing DLD patterns featured by geometrical information is limited. In this paper, we introduced a sparse representation based method to classify normal tissues and five types of DLD patterns including consolidation, ground-glass opacity, honeycombing, emphysema and nodular. Both CT values and eigenvalues of Hessian matrices were adopted to calculate local features. The 2360 VOIs from 117 subjects were separated into two independent set. One set was used to optimize parameters, and the other set was adopted to evaluation. The proposed technique has a overall accuracy of 95.4%. Experimental results show that our method would be useful to classify DLD patterns on HRCT images.
Keywords :
Hessian matrices; biological tissues; computerised tomography; diseases; eigenvalues and eigenfunctions; image classification; image recognition; image representation; lung; medical image processing; sparse matrices; CAD method; DLD pattern recognition; DLD patterns; HRCT images; Hessian matrices; VOI; biological tissues; computer-aided diagnosis method; consolidation pattern; diffuse lung disease pattern classification; eigenvalues; emphysema pattern; geometrical information; ground-glass opacity; high-resolution computed tomography; honeycombing pattern; nodular pattern; sparse representation based method; Computed tomography; Dictionaries; Diseases; Eigenvalues and eigenfunctions; Feature extraction; Lungs; Pattern recognition;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
Conference_Location :
Osaka
DOI :
10.1109/EMBC.2013.6610784