DocumentCode :
3208264
Title :
Long-term performance and reliability of crystalline silicon photovoltaic modules
Author :
Atmaram, Gobind H. ; Ventre, Gerard G. ; Maytrott, Craig W. ; Dunlop, James P. ; Swamy, Ramachandran
Author_Institution :
Florida Solar Energy Center, Cocoa, FL, USA
fYear :
1996
fDate :
13-17 May 1996
Firstpage :
1279
Lastpage :
1282
Abstract :
This study evaluates the long-term effects of outdoor exposure and high voltage operation on the performance and reliability of flat-plate crystalline silicon photovoltaic modules. The modules included Mobil Ra-180 EFG ribbon silicon modules, Photowatt MU-7061 and ARCO 16-2000 single-crystal silicon modules with round cells. In all three types of photovoltaic modules (Mobil, Photowatt and ARCO), no significant power loss occurred over more than ten years of outdoor operation in the warm, humid and ocean-salt environments of coastal Florida, USA. However, the wet insulation resistance values of a majority of the modules in all three types were lower than the values recommended in IEEE Standard 1262. The encapsulant discoloration, observed in all three types of modules, generally did not appear to have any effect on the modules´ power generation
Keywords :
elemental semiconductors; encapsulation; semiconductor device packaging; semiconductor device reliability; semiconductor device testing; silicon; solar cell arrays; solar cells; IEEE Standard 1262; Si; USA; crystalline Si photovoltaic modules; encapsulant discoloration; high voltage operation; long-term performance; long-term reliability; outdoor exposure; outdoor operation; power generation; wet insulation resistance; Crystallization; Electrical resistance measurement; Insulation; Photovoltaic systems; Power measurement; Safety; Silicon; Solar power generation; Temperature; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
ISSN :
0160-8371
Print_ISBN :
0-7803-3166-4
Type :
conf
DOI :
10.1109/PVSC.1996.564366
Filename :
564366
Link To Document :
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