Title :
Embedded DRAM architectural trade-offs
Author :
Wehn, Norbert ; Hein, Sren
Author_Institution :
Inst. of Microelectron. Syst., Kaiserslautern Univ., Germany
Abstract :
In this paper we discuss system-related aspects in embedded DRAM/logic designs. We focus on large embedded memories which have to be implemented as DRAMs
Keywords :
DRAM chips; memory architecture; DRAM/logic designs; architectural trade-offs; embedded DRAM; system-related aspects; Energy consumption; Frequency; Logic devices; Logic testing; Microelectronics; Packaging; Power supplies; Random access memory; Space technology; Wire;
Conference_Titel :
Design, Automation and Test in Europe, 1998., Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-8359-7
DOI :
10.1109/DATE.1998.655935
