DocumentCode
320835
Title
Efficient DC fault simulation of nonlinear analog circuits
Author
Tian, Michael W. ; Shi, C. J Richard
Author_Institution
Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
fYear
1998
fDate
23-26 Feb 1998
Firstpage
899
Lastpage
904
Abstract
This paper describes a method to improve the efficiency of nonlinear DC fault simulation. The method uses the Newton-Raphson algorithm to simulate each faulty circuit. The key idea is to order the given list of faults in such a way that the solution of previous faulty circuit can serve as a good initial point for the simulation of the next faulty circuit. To build a good ordering, one step Newton-Raphson iteration is performed for all the faulty circuits once, and the results are used to quantify how faulty circuits and the good circuit are close in their behaviors. With one-step Newton-Raphson iteration implemented by Householder´s formula, the proposed method has virtually no overhead. Experimental results on a set of 36 MCNC benchmark circuits show an average speedup of 4.4 and as high as 15 over traditional stand-alone fault simulation
Keywords
Newton-Raphson method; analogue circuits; analogue integrated circuits; circuit analysis computing; fault diagnosis; mixed analogue-digital integrated circuits; nonlinear network analysis; DC fault simulation; Householder formula; Newton-Raphson algorithm; faulty circuit; nonlinear analog circuits; one step Newton-Raphson iteration; Analog circuits; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Cities and towns; Computational modeling; Costs; Nonlinear equations;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 1998., Proceedings
Conference_Location
Paris
Print_ISBN
0-8186-8359-7
Type
conf
DOI
10.1109/DATE.1998.655964
Filename
655964
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