• DocumentCode
    320835
  • Title

    Efficient DC fault simulation of nonlinear analog circuits

  • Author

    Tian, Michael W. ; Shi, C. J Richard

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
  • fYear
    1998
  • fDate
    23-26 Feb 1998
  • Firstpage
    899
  • Lastpage
    904
  • Abstract
    This paper describes a method to improve the efficiency of nonlinear DC fault simulation. The method uses the Newton-Raphson algorithm to simulate each faulty circuit. The key idea is to order the given list of faults in such a way that the solution of previous faulty circuit can serve as a good initial point for the simulation of the next faulty circuit. To build a good ordering, one step Newton-Raphson iteration is performed for all the faulty circuits once, and the results are used to quantify how faulty circuits and the good circuit are close in their behaviors. With one-step Newton-Raphson iteration implemented by Householder´s formula, the proposed method has virtually no overhead. Experimental results on a set of 36 MCNC benchmark circuits show an average speedup of 4.4 and as high as 15 over traditional stand-alone fault simulation
  • Keywords
    Newton-Raphson method; analogue circuits; analogue integrated circuits; circuit analysis computing; fault diagnosis; mixed analogue-digital integrated circuits; nonlinear network analysis; DC fault simulation; Householder formula; Newton-Raphson algorithm; faulty circuit; nonlinear analog circuits; one step Newton-Raphson iteration; Analog circuits; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Cities and towns; Computational modeling; Costs; Nonlinear equations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 1998., Proceedings
  • Conference_Location
    Paris
  • Print_ISBN
    0-8186-8359-7
  • Type

    conf

  • DOI
    10.1109/DATE.1998.655964
  • Filename
    655964