Integrated diagnostic and repair information system (IDRIS)-an open system approach

Author

Bosco, Charles D. ; Su, Li Pi ; Darty, MarkA ; Kusek, Stephen M. ; Griffin, Brenda A. ; Lee, Thomas C.

Author_Institution

U.S. Army TMDE Activity, Redstone Arsenal, AL, USA

fYear

1995

fDate

8-10 Aug. 1995

Firstpage

496

Lastpage

502

Abstract

The IDRIS successfully established the proof-of-concept that easy-to-use software can be developed to integrate advanced test, diagnostics, communication, and maintenance software packages by creating an intuitive user interface to manage the complex software interfaces. Tests of IDRIS demonstrated that automating more of the complete maintenance procedure is possible and that can directly correlate to a decrease in the system´s mean time to repair (MTTR). A lower MTTR is one step toward simultaneously increasing the operational readiness and decreasing the life-cycle cost.

Keywords

automatic test equipment; automatic test software; command and control systems; computer communications software; fault diagnosis; integrated software; maintenance engineering; military computing; military equipment; military standards; open systems; software management; software packages; software tools; user interface management systems; BIT status; Howitzer automatic fire control system; IDRIS; MIL-STD-1553B simulator; Paladin tank; advanced software automation; advanced test software; communication software; complex software interfaces; diagnostics software; easy-to-use software; integrated diagnostic and repair information system; intuitive user interface; life-cycle cost; logistic needs; maintenance software packages; mean time to repair; open system approach; operational readiness; single interface environment; Automatic testing; Costs; Information systems; Management information systems; Software development management; Software maintenance; Software packages; Software testing; System testing; User interfaces;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record

Conference_Location

Atlanta, GA, USA

Print_ISBN

0-7803-2621-0

Type

conf

DOI

10.1109/AUTEST.1995.522716

Filename

522716