Title :
Radiation Hardness Of LSO:CE
Author :
Kobayashi, Masaaki ; Ishii, Mitsuru ; Melcher, Charles L.
Author_Institution :
National Laboratory for High Energy Physics
fDate :
31 Oct-6 Nov 1993
Keywords :
Annealing; Atom optics; Bleaching; Computed tomography; Degradation; Detectors; Laboratories; Nuclear physics; Positron emission tomography; Wavelength measurement;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1993., 1993 IEEE Conference Record.
Print_ISBN :
0-7803-1487-5
DOI :
10.1109/NSSMIC.1993.701664
