Title :
50% high efficiency 1 W power heterojunction FET for 3.5 V CDMA cellular phones
Author :
Yamaguchi, Keiko ; Iwata, Naotaka ; Tomita, Masatoshi
Author_Institution :
Kansai Electron. Res. Labs., NEC Corp., Shiga, Japan
Abstract :
This paper describes 950 MHz power performance of a double-doped AlGaAs/InGaAs/AlGaAs heterojunction FET (HJFET) operated at 3.5 V drain bias voltage (Vds) for CDMA cellular phones. A 20 mm gate width HJFET delivered a power-added efficiency (PAE) of 50%, an output power of 1.0 W and an associated gain of 16.1 dB with an adjacent channel leakage power ratio (ACPR) of -42 dBc at 0.9 MHz off-center frequency. High efficiency performance was achieved over a wide range of an output power level by controlling a gate bias voltage. Even at a low Vds of 2.0 V, PAE of 44% was achieved with 0.3 W output power and -42 dBc ACPR
Keywords :
III-V semiconductors; UHF field effect transistors; aluminium compounds; cellular radio; code division multiple access; gallium arsenide; indium compounds; junction gate field effect transistors; power field effect transistors; telephone sets; 1 W; 16.1 dB; 3.5 V; 50 percent; 950 MHz; AlGaAs-InGaAs-AlGaAs; CDMA cellular phone; adjacent channel leakage power ratio; double-doped AlGaAs/InGaAs/AlGaAs power heterojunction FET; gain; output power; power added efficiency; Cellular phones; FETs; Frequency; Gallium arsenide; Heterojunctions; Multiaccess communication; Power generation; Quadrature phase shift keying; Substrates; Voltage;
Conference_Titel :
Microwave Conference Proceedings, 1997. APMC '97, 1997 Asia-Pacific
Print_ISBN :
962-442-117-X
DOI :
10.1109/APMC.1997.656418