DocumentCode :
320908
Title :
Design and understanding of anisotropic conductive films (ACFs) for LCD packaging
Author :
Yim, Myung-Jin ; Paik, Kyung-Wook
Author_Institution :
Dept. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
fYear :
1997
fDate :
26-30 Oct 1997
Firstpage :
233
Lastpage :
242
Abstract :
Anisotropic conductive films (ACF) composed of an adhesive resin and fine conductive fillers such as metallic particles or metal-coated polymer balls are key materials for fine pitch chip-on-film (COF) and chip-on-glass (COG) LCD packaging. To understand and design better quality ACF materials, a conduction model with a physical contact mechanism was simulated and experimentally proved. To understand the contact area changes, two pressure dependent models - (1) elastic/plastic deformation and (2) FEM - were developed and proved by testing various ACFs. Experimental variables such as bonding pressure, and the number, size, mechanical and electrical properties of Ni powders and Au-coated polymer conductive particles were applied. The models agreed well with experimental results, except at higher bonding pressures. In general, as bonding pressure increases, sharp decrease in contact resistance followed by a constant value is observed after reaching a critical bonding pressure. However, excessive bonding pressure inversely increased the ACF connection resistance. If more conductive particles were added, the connection resistance rapidly decreased to a constant. This is the counter-effect of two opposing factors: resistance increase by decrease in contact area per particle and resistance decrease by increased conduction path numbers. Also, environmental effects on contact resistance and adhesion strength such as thermal aging, temperature/humidity aging and temperature cycling were also investigated. As a whole, better design of ACF materials can be achieved by understanding the ACF conduction mechanism
Keywords :
adhesion; ageing; conducting polymers; contact resistance; elastic deformation; electronic equipment testing; filled polymers; finite element analysis; liquid crystal displays; packaging; plastic deformation; polymer films; powder technology; thermal stresses; ACF conduction mechanism; ACF connection resistance; ACF material design; ACF materials; Au; Au-coated polymer conductive particles; FEM model; LCD packaging; Ni; Ni powders; adhesion strength; adhesive resin; anisotropic conductive films; bonding pressure; conduction model; conduction path numbers; conductive particles; contact area; contact resistance; critical bonding pressure; elastic/plastic deformation model; electrical properties; environmental effects; filler number; filler size; fine conductive fillers; fine pitch chip-on-film LCD packaging; fine pitch chip-on-glass LCD packaging; mechanical properties; metal-coated polymer balls; metallic particles; particle contact area; physical contact mechanism; temperature cycling; temperature/humidity aging; thermal aging; Aging; Anisotropic conductive films; Bonding; Conducting materials; Contact resistance; Inorganic materials; Packaging; Polymer films; Resins; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Polymeric Electronics Packaging, 1997. Proceedings., The First IEEE International Symposium on
Conference_Location :
Norrkoping
Print_ISBN :
0-7803-3865-0
Type :
conf
DOI :
10.1109/PEP.1997.656495
Filename :
656495
Link To Document :
بازگشت