Title : 
Large Package Transfer Molded DIP-IPM
         
        
            Author : 
Motto, E. ; Donlon, J. ; Shang, Ming ; Kuriaki, Kazuhiro ; Iwagami, Toru ; Kawafuji, Hisashi ; Nakano, Toshiya
         
        
            Author_Institution : 
Powerex Inc., Youngwood, PA
         
        
        
        
        
        
            Abstract : 
This paper presents a new larger version of the dual in-line package transfer molded Intelligent Power Module (DIP-IPM) developed by Mitsubishi Electric for home appliance motor control. The new large DIP-IPM utilizes a high thermal conductivity insulating resin sheet and an integrated aluminum heat spreader to provide the reduced thermal impedance and mechanical integrity required for a higher power applications. Using this approach the range DIP-IPM ratings has now been extended to 75 A at 600 V and 35 A at 1200 V. Like the lower power DIP-IPMs the new large DIP has high voltage integrated circuit (HVIC) based level shifting gate drive with short circuit protection and under voltage lock-out. However, in order to avoid the need for an excessively large current sensing resistor the new DIP uses IGBT chips with a current mirror emitter that produces a low level current proportional to the main emitter current for short circuit detection. In addition, the new DIP-IPM also provides an analog feedback signal proportional the module´s temperature.
         
        
            Keywords : 
domestic appliances; electric motors; electronics packaging; insulated gate bipolar transistors; power integrated circuits; IGBT chip; Mitsubishi Electric; analog feedback signal; current mirror emitter; dual in-line package; high voltage integrated circuit; home appliance motor control; integrated aluminum heat spreader; intelligent power module; large package transfer molded DIP-IPM; short circuit detection; thermal conductivity insulating resin sheet; Aluminum; Circuits; Electronics packaging; Home appliances; Impedance; Insulation; Motor drives; Multichip modules; Resins; Thermal conductivity;
         
        
        
        
            Conference_Titel : 
Industry Applications Society Annual Meeting, 2008. IAS '08. IEEE
         
        
            Conference_Location : 
Edmonton, Alta.
         
        
        
            Print_ISBN : 
978-1-4244-2278-4
         
        
            Electronic_ISBN : 
0197-2618
         
        
        
            DOI : 
10.1109/08IAS.2008.12