Abstract :
The following topics are dealt with: performance analysis; test coverage; fault localization and high-level validation.
Keywords :
fault diagnosis; performance evaluation; fault localization; high-level validation; performance analysis; test coverage;
Conference_Titel :
Formal Methods and Models for Codesign (MEMOCODE), 2012 10th IEEE/ACM International Conference on
Conference_Location :
Arlington, VA
Print_ISBN :
978-1-4673-1314-8
DOI :
10.1109/MEMCOD.2012.6292292
