DocumentCode
3209360
Title
Neuro-fuzzy approaches to fault diagnosis and identification
Author
Heywood, M.I. ; Chatwin, C.R.
Author_Institution
Sch. of Eng., Sussex Univ., Brighton
fYear
1997
fDate
35559
Firstpage
42552
Lastpage
42555
Abstract
Systems are becoming increasingly complex, with widespread use made of autonomous controllers, as in the case of decentralised control for complex chemical or flexible manufacturing systems. Furthermore, autonomous control system design focuses on the identification of analytical (as opposed to hardware) `redundancy´ in the form of a control theoretic plant model. The major drawbacks of any such analytical framework are: the computational overheads associated with supporting real time operation and, more significantly, the inability of the detection system performing any fault diagnosis operation to distinguish between modelling errors and the failure modes. This leads to a significant emphasis being placed on identifying a suitably robust representation of the plant. To be more specific, we identify three sources of deviation from the nominal analytical plant model: 1. fault conditions-we interpret these as having a deterministic form; 2. modelling errors-these we classify as having a possibilistic (fuzzy) interpretation; errors as a result of modelling approximations such as over simplification or idealising assumptions; 3. system and measurement noise-this represents a probabilistic (random) source of error
Keywords
fault diagnosis; autonomous control system design; autonomous controllers; computational overheads; control theoretic plant model; decentralised control; deterministic form; failure modes; fault conditions; fault diagnosis; fault diagnosis operation; flexible manufacturing systems; identification; measurement noise; modelling errors; neuro fuzzy approaches; nominal analytical plant model; possibilistic interpretation; probabilistic error source; real time operation;
fLanguage
English
Publisher
iet
Conference_Titel
Neural and Fuzzy Systems: Design, Hardware and Applications (Digest No: 1997/133), IEE Colloquium on
Conference_Location
London
Type
conf
DOI
10.1049/ic:19970736
Filename
643120
Link To Document