Title :
Computing architectural vulnerability factors for address-based structures
Author :
Biswas, Arijit ; Racunas, Paul ; Cheveresan, Razvan ; Emer, Joel ; Mukherjee, Shubhendu S. ; Rangan, Ram
Author_Institution :
FACT Group, Intel Corp., Hudson, MA, USA
Abstract :
Processor designers require estimates of the architectural vulnerability factor (AVF) of on-chip structures to make accurate soft error rate estimates. AVF is the fraction of faults from alpha particle and neutron strikes that result in user-visible errors. This paper shows how to use a performance model to calculate the AVF of address-based structures, using a data cache, a data translation buffer, and a store buffer as examples. We describe how to perform a detailed breakdown of lifetime components (e.g., fill-to-read, read-to-evict) of bits in these structures into ACE (required for architecturally correct execution), un-ACE (unnecessary for ACE), and unknown components. This lifetime analysis produces best estimate AVFs for these three structures´ data arrays of 6%, 36%, and 4%, respectively. We then present a new technique, hamming-distance-one analysis, and show that it predicts surprisingly low best estimate AVFs of 0.41%, 3%, and 7.7% for the structures´ tag arrays. Finally, using our lifetime analysis framework, we show how two AVF reduction techniques - periodic flushing and incremental scrubbing - can reduce the AVF by converting ACE lifetime components into un-ACE without affecting performance significantly.
Keywords :
computer architecture; error handling; system recovery; ACE lifetime component; address-based structure; architectural vulnerability factor; architecturally correct execution; data cache; data translation buffer; fill-to-read; hamming-distance-one analysis; incremental scrubbing; lifetime analysis framework; lifetime component breakdown; on-chip structure; periodic flushing; processor designer; read-to-evict; soft error rate estimate; store buffer; structure data array; structure tag array; user-visible error; Buffer storage; CADCAM; Computer aided manufacturing; Computer architecture; Computer errors; Computer science; Data analysis; Hamming distance; Statistics; Sun;
Conference_Titel :
Computer Architecture, 2005. ISCA '05. Proceedings. 32nd International Symposium on
Print_ISBN :
0-7695-2270-X
DOI :
10.1109/ISCA.2005.18