DocumentCode :
3209418
Title :
Improvements on an out-of-plane MEMS quadrupole for portable mass spectrometry
Author :
García, L. F Velásquez ; Cheung, K. ; Akinwande, A.I.
Author_Institution :
MIT, Cambridge
fYear :
2007
fDate :
8-12 July 2007
Firstpage :
2
Lastpage :
3
Abstract :
Quadrupoles are mass filters composed of a set of four cylindrical rods in a symmetrical setup that are biased with a combination of DC and RF potentials. There has been an active interest in developing scaled-down quadrupole technology for over a decade. This has led to remarkable results in both miniaturized and MEMS-based quadrupoles. This paper reports the design, fabrication, and characterization of a second generation of MEMS out-of-plane quadrupoles mass filter, part of a portable mass spectrometer for gas sensing. The mass spectrometer is composed of a CNT-based ionizer array, a MEMS quadrupole mass filter, MEMS electrometer for charge sensing, and a MEMS displacement pump that provides the required vacuum level. Two key advantages of scaling down quadrupoles are device portability and the relaxation on the vacuum level required for operation. For a fixed rod aspect ratio the quadrupole weight roughly scales to the cube of the rod diameter. Also, scaled down quadrupoles can work at higher pressure provided the gas mean free-path is larger than the quadrupole length. We have experimentally demonstrated that higher working pressure, up to the mTorr level, is compatible with our CNT-based electron impact and field ionizers with no loss in ionizer performance, thus setting the maximum quadrupole length at 5 cm.
Keywords :
gas sensors; mass spectrometer accessories; mass spectroscopy; micromechanical devices; carbon nanotube-based electron impact; field ionizers; gas sensing; out-of-plane MEMS quadrupole; portable mass spectrometry; quadrupole mass filter; working pressure; Assembly; Computer science; Etching; Filters; Mass spectroscopy; Micromechanical devices; Optical microscopy; Performance loss; Radio frequency; Springs;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-1133-7
Electronic_ISBN :
978-1-4244-1134-4
Type :
conf
DOI :
10.1109/IVNC.2007.4480906
Filename :
4480906
Link To Document :
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