Title :
AC performance of a novel carbon nanotube vacuum field emission differential amplifier IC
Author :
Wong, Y.M. ; Kang, W.P. ; Davidson, J.L. ; Kerns, D.V. ; Huang, J.H.
Author_Institution :
Vanderbilt Univ., Nashville
Abstract :
In this study, analytical modeling and AC measurements of the commom-mode rejection ratio (CMRR) of a single-chip carbon nanotube (CNT) vacuum field emission (VFE) differential amplifier (diff-amp) utilizing 2 mum conical-shaped CNT field emitter was presented. Dual-mask microfabrication process coupled with microwave plasma-enhanced chemical vapor deposition (MPCVD) growth of CNT emitters was employed to fabricate the matched VFE triode pairs with built-in split gates and integrated anodes to achieve a single-chip VFE diff-amp.
Keywords :
carbon nanotubes; differential amplifiers; field emission; integrated circuits; nanoelectronics; plasma CVD; triodes; vacuum microelectronics; AC measurement; C; CMRR; analytical modeling; commom-mode rejection ratio; conical-shaped CNT field emitter; dual-mask microfabrication process; microwave plasma CVD growth; plasma-enhanced chemical vapor deposition; single-chip carbon nanotube; vacuum field emission triode pairs; Analytical models; Anodes; Carbon nanotubes; Differential amplifiers; History; Materials science and technology; Military communication; Nanoelectronics; Plasma temperature; Vacuum technology;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-1133-7
Electronic_ISBN :
978-1-4244-1134-4
DOI :
10.1109/IVNC.2007.4480909
