DocumentCode :
3209477
Title :
FAST: Formal specification driven test harness generation
Author :
Gong, Jiong ; Wang, Yun ; Shen, Haihao ; Deng, Xu ; Wang, Wei ; Ma, Xiangning
Author_Institution :
Intel Corp., Shanghai, China
fYear :
2012
fDate :
16-17 July 2012
Firstpage :
33
Lastpage :
42
Abstract :
Full coverage testing is commonly perceived as a mission impossible because software is more complex than ever and produces vast space to cover. This paper introduces a novel approach which uses ACSL formal specifications to define and reach test coverage, especially in the sense of data coverage. Based on this approach, we create a tool chain named FAST which can automatically generate test harness code and verify program´s correctness, turning formal specification and static verification into coverage definition and dynamic testing. FAST ensures completeness of test coverage and result checking by leveraging the formal specifications. We have applied this methodology and tool chain to a real-world mission critical software project that requires high quality standard. Our practice shows using FAST detects extra code bugs that escape from other validation methods such as manually-written tests and random/fuzz tests. It also costs much less human efforts with higher bug detection rate and higher code and data coverage.
Keywords :
program debugging; program diagnostics; program testing; program verification; safety-critical software; ACSL formal specifications; FAST; coverage definition; critical software project; data coverage; dynamic testing; extra code bug detection; formal specification driven test harness generation; full coverage testing; fuzz tests; manually-written tests; program correctness verification; random tests; static verification; test coverage; Formal specifications; Generators; Manuals; Mission critical systems; Resource management; Software; Testing; ACSL; Data Coverage; Formal Specification Language; Test Generation; Test Harness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Formal Methods and Models for Codesign (MEMOCODE), 2012 10th IEEE/ACM International Conference on
Conference_Location :
Arlington, VA
Print_ISBN :
978-1-4673-1314-8
Type :
conf
DOI :
10.1109/MEMCOD.2012.6292298
Filename :
6292298
Link To Document :
بازگشت