DocumentCode
3209493
Title
Studies on silhouette quality and gait recognition
Author
Liu, Zongyi ; Malave, Laura ; Sarkar, Sudeep
Author_Institution
Comput. Sci. & Eng., South Florida Univ., Tampa, FL, USA
Volume
2
fYear
2004
fDate
27 June-2 July 2004
Abstract
Recognition of a person from gait has been a focus in computer vision. It is one biometric source that can be acquired at a distance. At this nascent stage of gait recognition research, the pertinent research questions are those related to understanding the limits of gait recognition and the quantitative study of the various factors effecting gait. However, performances of contemporary algorithms have been confounded by errors in the extracted silhouettes, which has been the low-level representation of choice. In this work, (i) we present to the research community a segmentation "ground truth" research resource consisting of a set of manually specified part-level silhouettes for 70 subjects from the formulated gait challenge database, under different conditions involving change in surface, shoe-type, and time; a total of about 8000 manual silhouettes. (ii) We expound an HMM eigen stance model-based silhouette reconstruction method to correct for common errors in silhouette detection arising from shadows and background subtraction. And (iii) using these "cleaned" silhouettes and the manual silhouettes we show that the effects of various factors such as surface, time, and shoe on gait recognition are not due to poor silhouette quality. In fact, the recognition performance actually drops with the use of "clean " silhouettes because of removal of correlation in the error pixel patterns.
Keywords
computer vision; database management systems; eigenvalues and eigenfunctions; hidden Markov models; image recognition; image reconstruction; HMM eigen stance model; computer vision; correlation removal; error pixel patterns; gait challenge database; gait recognition; person recognition; segmentation ground truth research resource; silhouette detection; silhouette quality; silhouette reconstruction method; Biometrics; Computer vision; Databases; Error correction; Footwear; Hidden Markov models; Pattern recognition; Reconstruction algorithms; Surface cleaning; Surface reconstruction;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition, 2004. CVPR 2004. Proceedings of the 2004 IEEE Computer Society Conference on
ISSN
1063-6919
Print_ISBN
0-7695-2158-4
Type
conf
DOI
10.1109/CVPR.2004.1315233
Filename
1315233
Link To Document