DocumentCode :
3209493
Title :
Studies on silhouette quality and gait recognition
Author :
Liu, Zongyi ; Malave, Laura ; Sarkar, Sudeep
Author_Institution :
Comput. Sci. & Eng., South Florida Univ., Tampa, FL, USA
Volume :
2
fYear :
2004
fDate :
27 June-2 July 2004
Abstract :
Recognition of a person from gait has been a focus in computer vision. It is one biometric source that can be acquired at a distance. At this nascent stage of gait recognition research, the pertinent research questions are those related to understanding the limits of gait recognition and the quantitative study of the various factors effecting gait. However, performances of contemporary algorithms have been confounded by errors in the extracted silhouettes, which has been the low-level representation of choice. In this work, (i) we present to the research community a segmentation "ground truth" research resource consisting of a set of manually specified part-level silhouettes for 70 subjects from the formulated gait challenge database, under different conditions involving change in surface, shoe-type, and time; a total of about 8000 manual silhouettes. (ii) We expound an HMM eigen stance model-based silhouette reconstruction method to correct for common errors in silhouette detection arising from shadows and background subtraction. And (iii) using these "cleaned" silhouettes and the manual silhouettes we show that the effects of various factors such as surface, time, and shoe on gait recognition are not due to poor silhouette quality. In fact, the recognition performance actually drops with the use of "clean " silhouettes because of removal of correlation in the error pixel patterns.
Keywords :
computer vision; database management systems; eigenvalues and eigenfunctions; hidden Markov models; image recognition; image reconstruction; HMM eigen stance model; computer vision; correlation removal; error pixel patterns; gait challenge database; gait recognition; person recognition; segmentation ground truth research resource; silhouette detection; silhouette quality; silhouette reconstruction method; Biometrics; Computer vision; Databases; Error correction; Footwear; Hidden Markov models; Pattern recognition; Reconstruction algorithms; Surface cleaning; Surface reconstruction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 2004. CVPR 2004. Proceedings of the 2004 IEEE Computer Society Conference on
ISSN :
1063-6919
Print_ISBN :
0-7695-2158-4
Type :
conf
DOI :
10.1109/CVPR.2004.1315233
Filename :
1315233
Link To Document :
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