Title :
XPS and LEED analyses on the extremely low work function surface of W(100) modified by yttrium oxide.
Author :
Kawakubo, Takashi ; Shimoyama, Yusuke ; Nakane, Hideaki ; Adachi, Hiroshi
Author_Institution :
Muroran Inst. of Technol., Muroran
Abstract :
XPS and LEED analyses have been done for tungsten (100) surface modified by use of Y2O3. No shift in Y-3d XPS peak is observed for heat treatment, suggesting that Y-O composite cannot be expected, in contrast to the case of ZrO/W(100) surface for which Zr-O composite is believed to exist. The particular LEED pattern is also different with each other: p(2X1) double domain pattern for YO/W(100) and c(4X2) double domain pattern for ZrO/W(100).
Keywords :
X-ray photoelectron spectra; composite materials; heat treatment; low energy electron diffraction; tungsten; yttrium compounds; zirconium compounds; LEED analysis; W; XPS analysis; Y-O composites; Y2O3; ZrO composites; ZrO-W; double domain pattern; heat treatment; tungsten surface modification; yttrium oxide; Chemicals; Electron emission; Heat treatment; Heating; Industrial electronics; Needles; Powders; Surface treatment; Tungsten; Yttrium;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-1133-7
Electronic_ISBN :
978-1-4244-1134-4
DOI :
10.1109/IVNC.2007.4480915
