Abstract :
Presents the welcome message from the conference proceedings.
Keywords :
CMOS process; CMOS technology; Chapters; Conferences; Dielectric materials; Electron Devices Society; Electron devices; Microelectronics; Region 6; Sections;
Conference_Titel :
Microelectronics and Electron Devices, 2005. WMED '05. 2005 IEEE Workshop on
Conference_Location :
Boise, ID
Print_ISBN :
0-7803-9072-5
DOI :
10.1109/WMED.2005.1431591
