• DocumentCode
    3209719
  • Title

    Comparison of Test Methods for Characterisation of a Doubly-Fed Induction Machine

  • Author

    Cashman, David P. ; Hayes, John G. ; Egan, Micheal G.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. Coll. Cork, Cork
  • fYear
    2008
  • fDate
    5-9 Oct. 2008
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    The doubly-fed induction machine is widely used in variable speed ac drives. Accurate characterisation of the machine is important to optimise its efficiency and functionality. A novel characterisation method using the series-coupling test approach has produced favourable results in characterising this machine. This paper reviews the series-coupling tests and compares their results with IEEE Standard 112. The conventional IEEE Standard 112, series-coupling and extended short-circuit testing procedures are used to characterise the machine. The various models obtained from these methods are validated by comparing the model predictions with the experimental torque- speed curve of the machine. The series-coupling test models perform best in predicting the machine performance. A sensitivity analysis of the test procedures is carried out to determine the influence errors in experimental measurements have on the respective models. Finally, the variation of parameters with applied test conditions in the series-coupling procedure is investigated.
  • Keywords
    asynchronous machines; machine testing; sensitivity analysis; short-circuit currents; torque; velocity; doubly-fed induction machine; experimental torque- speed curve; extended short-circuit testing; sensitivity analysis; series-coupling tests; test method; variable speed AC drives; Circuit testing; Educational institutions; Induction machines; Parameter estimation; Performance evaluation; Power system modeling; Predictive models; Sensitivity analysis; Steady-state; Transformers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting, 2008. IAS '08. IEEE
  • Conference_Location
    Edmonton, Alta.
  • ISSN
    0197-2618
  • Print_ISBN
    978-1-4244-2278-4
  • Electronic_ISBN
    0197-2618
  • Type

    conf

  • DOI
    10.1109/08IAS.2008.33
  • Filename
    4658821