DocumentCode :
3209918
Title :
Simulation as an aid to power supply diagnostics [for F-15 plane]
Author :
Carmichael, Norman ; Camargo, Christopher ; Harrison, Travis ; Gomez, Ralph
Author_Institution :
Southwest Res. Inst., San Antonio, TX, USA
fYear :
1995
fDate :
8-10 Aug. 1995
Firstpage :
556
Lastpage :
560
Abstract :
Off-line modeling of electronic circuitry including power supply circuitry is available in several software packages. These packages can be hosted on personal computer or workstation platforms. Modeling of power supply circuit configurations allows the circuit designer to analyze the circuit for stability and component stress and to select components. Circuits are typically modelled as 5 to 15 components where a component may be one or more physical components. While simulation and modeling are necessary for power supply design and design analysis, the use of simulation tools for power supply testing is not widely recognized. Simulation allows a fault to be inserted without damaging the power supply under test. This benefit is particularly important because failures in power supplies often have an avalanche effect. One failure can propagate to damage several other components. This paper explores the application of simulation to the design of diagnostic fault trees of the Test Program Set.
Keywords :
SPICE; aerospace computing; aerospace simulation; aircraft testing; automatic test software; avionics; circuit analysis computing; fault trees; integrated circuit modelling; military aircraft; military avionics; military computing; power supply circuits; transient analysis; F-15 power supplies; PSpice; automatic testing; circuit simulation; component faults; diagnostic fault trees; linear regulator; off-line modelling; overstress conditions; power supply diagnostics; simulation tools; switching regulator; test program set; Analytical models; Circuit analysis; Circuit simulation; Computational modeling; Electronics packaging; Microcomputers; Power supplies; Software packages; Testing; Workstations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-2621-0
Type :
conf
DOI :
10.1109/AUTEST.1995.522724
Filename :
522724
Link To Document :
بازگشت